Josephson latching driver with a low bit-error rate

被引：3
|
作者：
Harada, N [1 ]
Yoshikawa, N
Yoshida, A
Yokoyama, N
机构：
[1] Fujitsu Ltd, Atsugi, Kanagawa 2430197, Japan
[2] Yokohama Natl Univ, Yokohama, Kanagawa 2408501, Japan
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2004年 / 14卷 / 04期
关键词：
Josephson junctions; Josephson logic; superconducting devices;
D O I：
10.1109/TASC.2004.837112
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new Josephson latching driver with a current-injection device at an input port has been developed and tested. It has high input sensitivity and a wide bias margin. Under an optimal bias condition, the bit-error rate (BER) of this driver is below 10(-12) at data rates of 5 and 10 Gb/s. The driver can be switched by superconducting single-flux quantum (SFQ) pulse input and can be used as an amplifier to test the BER of SFQ circuits. In such a test, the BER of an SFQ converter operating at 5 Gb/s was less than 10(-12) with bias margin of +/- 20%.
引用
收藏
页码：2031 / 2036
页数：6
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