Study of the contact angle of water droplet on the surface of natural K-feldspar with the combination of Ar+ polishing and atomic force microscopy scanning

被引:8
|
作者
Rao, Shihang [1 ,3 ,4 ]
Deng, Yajun [1 ,3 ,4 ]
Cai, Wenjiu [1 ,3 ,4 ]
Li, Zhenchao [2 ,3 ,4 ]
Ye, Jianliang [5 ]
Lu, Hailong [2 ,3 ,4 ]
机构
[1] Peking Univ, Coll Engn, Beijing 100871, Peoples R China
[2] Peking Univ, Sch Earth & Space Sci, Beijing 100871, Peoples R China
[3] Peking Univ, Beijing Int Ctr Gas Hydrate, Beijing 100871, Peoples R China
[4] Peking Univ Shenzhen Grad Sch, Sch Marine Sci & Technol, Shenzhen 518055, Peoples R China
[5] China Geol Survey, Guangzhou Marine Geol Survey, Guangzhou 510075, Peoples R China
关键词
Contact angle; Wettability; K-feldspar; Heterogeneity; atomic force microscopy (AFM); Argon ion polishing; ION-BEAM FIB; SOLID-SURFACES; FREE-ENERGY; QUARTZ; WETTABILITY; RESERVOIR; MICROANALYSIS; NANOBUBBLES; COMPONENTS; TENSION;
D O I
10.1016/j.ces.2021.116705
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Wettability is a key property of a reservoir rock, which can significantly affect the distribution and transportation of fluids (gas, oil, water, etc.) in reservoir pores which are constructed with various minerals. As for sandstone reservoirs, quartz and feldspar are the common minerals of the framework. However, the study on the wettability of feldspar is much less than that of quartz probably due to the strong heterogeneity and complex composition of natural feldspar minerals. In this study, a method for measuring the contact angle of water droplet on a natural mineral surface is proposed by combining argon ion polishing technique with atomic force microscopy scanning (Ar+-AFM method). Compared with the traditional optical goniometer measurement, this method can apparently reduce the influence of heterogeneity on the wettability of K-feldspar surface and yield more consistent contact angle data. (C) 2021 Elsevier Ltd. All rights reserved.
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页数:8
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  • [1] Direct measurement of the contact angle of water droplet on quartz in a reservoir rock with atomic force microscopy
    Deng, Yajun
    Xu, Lei
    Lu, Hailong
    Wang, Hao
    Shi, Yongmin
    [J]. CHEMICAL ENGINEERING SCIENCE, 2018, 177 : 445 - 454
  • [2] A comparative study of surface energy data from atomic force microscopy and from contact angle goniometry
    Lamprou, Dimitrios A.
    Smith, James R.
    Nevell, Thomas G.
    Barbu, Eugen
    Stone, Corinne
    Willis, Colin R.
    Tsibouklis, John
    [J]. APPLIED SURFACE SCIENCE, 2010, 256 (16) : 5082 - 5087
  • [3] Links between nanoscale and macroscale surface properties of natural root mucilage studied by atomic force microscopy and contact angle
    Kaltenbach, Robin
    Diehl, Doerte
    Schaumann, Gabriele E.
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2018, 516 : 446 - 455
  • [4] Atomic force microscopy, scanning electric potential microscopy and contact-angle surface analysis of low-density polyethylene grafted with maleic anhydride
    Porto, MF
    Girotto, EM
    Kunita, MH
    Gonçalves, MD
    Muniz, EC
    Rubira, AF
    Radovanovic, E
    [J]. SURFACE AND COLLOID SCIENCE, 2004, 128 : 86 - 91
  • [5] Surface modification of Sylgard 184 polydimethylsiloxane by 254 nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy
    Waddell, Emanuel A.
    Shreeves, Stephen
    Carrell, Holly
    Perry, Christopher
    Reid, Branden A.
    McKee, James
    [J]. APPLIED SURFACE SCIENCE, 2008, 254 (17) : 5314 - 5318
  • [6] Effect of different polishing systems on the surface roughness of various bulk-fill and nano-filled resin-based composites: An atomic force microscopy and scanning electron microscopy study
    Kilic, Vahti
    Gok, Adem
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2021, 84 (09) : 2058 - 2067
  • [7] Atomic force microscopy observation of surface morphologies and measurements of local contact potential differences of amorphous solid water samples deposited at 15 and 100 K
    Tomaru, Takuto
    Hidaka, Hiroshi
    Kouchi, Akira
    Watanabe, Naoki
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2024, 26 (21) : 15232 - 15239
  • [8] Contact angle and atomic force microscopy study of reactions of n-alkyltrichlorosilanes with Muscovite micas exposed to water vapor plasmas with various power densities
    Nakagawa, Tohru
    Soga, Mamoru
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1997, 36 (11): : 6915 - 6921
  • [9] Contact angle and atomic force microscopy study of reactions of n-alkyltrichlorosilanes with muscovite micas exposed to water vapor plasmas with various power densities
    Nakagawa, T
    Soga, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (11): : 6915 - 6921
  • [10] Brewster Angle Microscope and Atomic Force Microscopy study of poly 4-(n-methacyloyl)-Disperse Red 1-methacrylic acid monolayer at the air/water interface and on the glass surface
    Kang, YS
    An, SD
    [J]. MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2001, 371 : 53 - 56