Structure and dynamics of thin polymer films using synchrotron X-ray scattering

被引:2
|
作者
Jiang, Zhang
Kim, Hyunjung
Lee, Heeju
Lee, Young Joo
Jiao, Xuesong
Li, Chunhua
Lurio, Laurence B.
Hu, Xuesong
Lal, Jyotsana
Narayanan, Suresh
Sandy, Alec
Rafailovich, Miriam
Sinha, Sunil K. [1 ]
机构
[1] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA
[2] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[3] Sogang Univ, Interdisciplinary Program Integrated Biotechnol, Seoul 121742, South Korea
[4] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA
[5] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
[6] Argonne Natl Lab, Intense Pulsed Neutron Source, Argonne, IL 60439 USA
[7] Adv Photon Source, Argonne, IL 60439 USA
[8] Los Alamos Natl Lab, LANSCE, Los Alamos, NM 87545 USA
关键词
GLASS-TRANSITION TEMPERATURE; REPTATION; INTERFACE; SURFACES;
D O I
10.1107/S0021889807007996
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Recent measurements of the scattering function and of the dynamics of surface and interfacial fluctuations in thin supported molten films and bilayers using synchrotron X-ray diffuse scattering and photon correlation spectroscopy in reflection geometry are reported. The results for monolayer films thicker than four times of the radius of gyration of polystyrene show behavior of normal over-damped capillary waves expected for the surface fluctuations of a viscous liquid. However, thinner films show deviations indicating the need to account for viscoelasticity. The theory has been extended to the surface and interfacial modes in a bilayer film system. The results are discussed in terms of surface tension, viscosity and shear modulus. Also recent experiments to measure the isothermal compressibility of supported polystyrene films by studying 'bulk' scattering from the interior of the films is discussed.
引用
收藏
页码:S18 / S22
页数:5
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