Hydrogen-acetylene gas ratio and catalyst thickness effect on the growth of uniform layer of carbon nanotubes

被引:5
|
作者
Sharma, Anup Kumar [1 ]
Sharma, Ritu [1 ]
Chaudhary, Upendra [1 ]
机构
[1] MNIT, Dept Elect Engn, Jaipur, Rajasthan, India
关键词
X-ray diffraction (XRD); Raman spectra; Hall measurement system; transmission electron microscopy (TEM); scanning electron microscopy (SEM); CHEMICAL-VAPOR-DEPOSITION; THIN-FILM; MORPHOLOGY; DISPERSION; FIBERS;
D O I
10.1080/1536383X.2017.1320545
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Effect of catalyst thickness (2, 4, and 6 nm) and acetylene-hydrogen gas ratio (1/4, 2/4, and 3/4) on the synthesis of carbon nanotubes is reported in this article. Synthesized nanotubes are characterized by X-ray diffraction, scanning electron microscopy (SEM), transmission electron microscopy, and Raman effect. From SEM results, nanotubes growth is less for higher thickness, as at higher thickness catalyst nanoparticles agglomerate which suppress the growth of nanotubes. Raman spectroscopy results reveal that at higher thickness defects density increases. Nanotube of better crystallinity and graphitic outer walls grows for lower acetylene-hydrogen gas ratio and at smaller thickness of catalyst layer. The sheet resistance of carbon nanotube thin film is measured by using Hall effect measurement systems. Smallest sheet resistance among synthesized multi-walled carbon nanotubes sample is obtained for nanotubes grown on 2 nm thick catalyst film and is 0.9 k/square.
引用
收藏
页码:397 / 403
页数:7
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