Study on the degradation mechanism of organic light-emitting diodes (OLEDs)

被引：31
|
作者：
Zou, DC [1 ]
Yahiro, M
Tsutsui, T
机构：
[1] Japan Sci & Technol Cooperat, CREST, Tsutsui team, Fukuoka 816, Japan
[2] ASTEC, Fukuoka 816, Japan
[3] Kyushu Univ, Grad Sch Engn Sci, Dept Mat Sci & Technol, Fukuoka 816, Japan
来源：
SYNTHETIC METALS | 1997年 / 91卷 / 1-3期
关键词：
degradation; spontaneous recovery; electric-field induced recovery; electric-field induced enhancement; dipoles; internal electric field; carrier injection; light-emitting diodes;
D O I：
10.1016/S0379-6779(97)04012-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The degradation mechanism occurring in organic light-emitting diodes (OLEDs), especially the recovery behaviour related to this degradation, was investigated. It was found that the recovery can to some extent occur spontaneously. However, recovery can also be achieved through the application of an external electric field. The recovery rate associated with electric-field induced recovery is considerably larger than that arising from spontaneous recovery. A degradation model which can explain well many of the phenomena related to the degradation of OLEDs is proposed. (C) 1997 Elsevier Science S.A.
引用
收藏
页码：191 / 193
页数：3
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