共 50 条
- [21] Effect of oxygen content on reliability of Au-20Sn solder joints for the chip-level package Journal of Materials Science: Materials in Electronics, 2020, 31 : 1411 - 1420
- [24] Kinetics of the Au-Ni-Sn ternary intermetallic layer redeposition at the solder/under-bump metallurgy interface during aging treatment Journal of Electronic Materials, 2004, 33 : 28 - 33
- [25] STUDY OF PROPERTIES OF LEAD-FREE SOLDER TYPE Au-20Sn AT ULTRASOUND ASSISTANCE PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE OF DAAAM BALTIC INDUSTRIAL ENGINEERING, VOLS 1 AND 2, 2012, : 616 - 620
- [27] Selective formation of intermetallic compounds in Sn-20In-0.8Cu ball grid array solder joints with Au/Ni surface finishes Journal of Electronic Materials, 2004, 33 : 940 - 947
- [29] Effects of solder volume on redeposition of (Au,Ni)Sn4 intermetallics in SnAgCu solder joints ICEPT: 2006 7TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2006, : 374 - +