2D microwave imaging reflectometer electronics

被引:0
|
作者
Spear, A. G. [1 ]
Domier, C. W. [1 ]
Hu, X. [1 ]
Muscatello, C. M. [1 ]
Ren, X. [1 ]
Tobias, B. J. [2 ]
Luhmann, N. C., Jr. [1 ]
机构
[1] Univ Calif Davis, Davis, CA 95616 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 11期
关键词
PLASMAS;
D O I
10.1063/1.4891047
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A 2D microwave imaging reflectometer system has been developed to visualize electron density fluctuations on the DIII-D tokamak. Simultaneously illuminated at four probe frequencies, large aperture optics image reflections from four density-dependent cutoff surfaces in the plasma over an extended region of the DIII-D plasma. Localized density fluctuations in the vicinity of the plasma cutoff surfaces modulate the plasma reflections, yielding a 2D image of electron density fluctuations. Details are presented of the receiver down conversion electronics that generate the in-phase (I) and quadrature (Q) reflectometer signals from which 2D density fluctuation data are obtained. Also presented are details on the control system and backplane used to manage the electronics as well as an introduction to the computer based control program. (C) 2014 AIP Publishing LLC.
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页数:3
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