High speed interconnect data dependent jitter analysis

被引：1

作者：

Xia, Tian ^{[1
]}

Mu, Di ^{[1
]}

机构：

[1] Univ Vermont, Sch Engn, Burlington, VT 05405 USA

来源：

MICROELECTRONICS JOURNAL | 2010年 / 41卷 / 06期

关键词：

Data dependent jitter; Inteconnect; Fourier analysis;

D O I：

10.1016/j.mejo.2010.04.007

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper focuses on modeling and characterizing the data dependent jitter (DDJ) in high-speed interconnect. The analysis process is performed based on the Fourier series using the interconnect RLC model. By calculating the pattern dependent delay deviations, the DDJ is characterized. To validate the model accuracy, the analysis results have been compared against Cadence simulations. The interconnect layout optimization is also explored to minimize the DDJ. (C) 2010 Elsevier Ltd. All rights reserved.

引用

页码：371 / 379

页数：9

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