Quantum-Dots Photosensor with Wide Bandgap P-Type and N-Type Oxide Semiconductors for High Detectivity and Responsivity

被引:24
|
作者
Kim, Yoseob [1 ]
Kim, Jeonggi [1 ]
Kim, Hyo-Min [1 ]
Jang, Jin [1 ]
机构
[1] Kyung Hee Univ, Dept Informat Display, ADRC, 26 Kyungheedae Ro, Seoul 02447, South Korea
来源
ADVANCED MATERIALS TECHNOLOGIES | 2020年 / 5卷 / 01期
关键词
high detectivity; low dark current; photosensors; quantum-dots photodiodes; wide bandgap oxides; LIGHT-EMITTING DEVICES; TIN-OXIDE; THIN-FILM; PHOTODIODES; PERFORMANCE; PHOTODETECTORS; NANOCRYSTALS; LAYER; RECOMBINATION; TRANSPARENT;
D O I
10.1002/admt.201900857
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The photodiode is a promising architecture for photodetection because of its fast response and high external quantum efficiency (EQE). The photodiode requires high detectivity, responsivity, and low dark current for various applications. Here, a new structure of quantum-dots (QD) photodiode is reported for ultraviolet (UV), blue, green, and red light sensing using a red QD layer between p-type and n-type metal-oxide semiconductors. CdZnSeS/ZnS QD is used for photoabsorption with p-type Cu2SnS3-Ga2O3 and n-type Li doped ZnO (LZO) for carrier collection. The QD photodiode has a low dark current density of 2.08 nA cm(-2) at -1 V leading to high rectification ratio of approximate to 10(5). The QD photodiode shows superior properties with responsivity of 0.258 A W-1 and detectivity of 1.00 x 10(13) Jones at -1 V under green illumination. The rise and fall times of QD photodiode are 2.1 and 2.6 ms, respectively. The QD photodiode on a flexible polyimide (PI) substrate is also demonstrated, exhibiting stable characteristics under bending test of 20 000 cycles at a bending radius of 0.32 mm.
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页数:8
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