Status and future of DUV photoresists for the semiconductor industry

被引:10
|
作者
Thackeray, JW [1 ]
机构
[1] Shipley Co Inc, Marlborough, MA 01752 USA
关键词
D O I
10.1016/S0167-9317(98)00009-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reviews the development of positive DUV resists at IBM and Shipley. The review begins with APEX-E the prototypical chemically amplified positive DUV resist used throughout the semiconductor industry. The paper then follows the emergence of new resist technology to overcome the weaknesses of first generation DUV resists like APEX-E. These improvements include feature-specific resists for low k(1) processing, improved delay stability, improved PEB sensitivity, better etch resistance, and reduced substrate dependence. A new series of annealing type resists, UV5, UV6, and Titan have demonstrated all of these improvements.
引用
收藏
页码:37 / 40
页数:4
相关论文
共 50 条
  • [1] Future markets and applications of photoresists for the semiconductor industry.
    Dammel, RR
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 217 : U214 - U215
  • [2] Characterization of advanced DUV photoresists
    Krishna, MS
    Gurer, E
    Lee, E
    Lewellen, J
    Golden, K
    Salois, J
    Flores, GE
    Wackerman, S
    Reynolds, R
    [J]. MICROLITHOGRAPHY 1999: ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVI, PTS 1 AND 2, 1999, 3678 : 1307 - 1314
  • [3] Lithographic performance of recent DUV photoresists
    Streefkerk, B
    Schenau, KV
    Buijk, C
    [J]. ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XV, PTS 1 AND 2, 1998, 3333 : 987 - 996
  • [4] The impact of airborne molecular bases on DUV photoresists
    Ruede, D
    Ercken, M
    Borgers, T
    [J]. SOLID STATE TECHNOLOGY, 2001, 44 (08) : 63 - +
  • [5] Process optimisation of DUV photoresists for electron beam lithography
    Thoms, S
    Macintyre, D
    [J]. MICROELECTRONIC ENGINEERING, 1999, 46 (1-4) : 287 - 290
  • [6] Process latitude comparison of advanced DUV photoresists to latest generation 193nm photoresists
    Joesten, L
    Reilly, N
    Linskens, F
    Jehoul, C
    Parker, C
    [J]. OPTICAL MICROLITHOGRAPHY XIV, PTS 1 AND 2, 2001, 4346 : 936 - 944
  • [7] PHOTORESISTS AND SEMICONDUCTOR TECHNOLOGY
    HALLER, I
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1977, 174 (SEP): : 79 - 79
  • [8] THE FUTURE OF THE EUROPEAN SEMICONDUCTOR INDUSTRY
    SAVAGE, PJ
    [J]. SOLID STATE TECHNOLOGY, 1987, 30 (02) : 118 - 118
  • [9] Future of Korean semiconductor industry
    Oh, KH
    Lee, CH
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1997, 30 : S176 - S181
  • [10] Future of Korean semiconductor industry
    Min, S
    Lee, C
    [J]. JOURNAL OF RARE EARTHS, 2000, 18 (03) : 89 - 96