An economical vision-based method to obtain whole-field deformation profiles

被引：2
|
作者：
Chu, T [1 ]
Mahajan, A
Liu, CT
机构：
[1] So Illinois Univ, Dept Mech Engn, Carbondale, IL 62901 USA
[2] So Illinois Univ, Dept Mech Engn & Energy Proc, Carbondale, IL 62901 USA
[3] AFRL, PRSM, Edwards AFB, CA USA
来源：
EXPERIMENTAL TECHNIQUES | 2002年 / 26卷 / 06期
关键词：
D O I：
10.1111/j.1747-1567.2002.tb00087.x
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Image correlation using off-the-shelf technology coupled with genetic algorithms was used to measure surface deformation profiles. A particulate composite was used to demonstrate the technology. The significance of the method lies in the ability to use the set-up in the field and obtain whole-field deformation profiles quickly and economically by using an economical camera connected to a laptop computer.
引用
收藏
页码：25 / 28
页数：4
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