Surface-Potential-Based RF Large Signal Model for Gallium Nitride HEMTs

被引:0
|
作者
Khandelwal, S. [1 ]
Ghosh, S. [2 ]
Chauhan, Y. S. [2 ]
Iniguez, B. [3 ,4 ]
Fjeldly, T. A. [3 ,4 ]
机构
[1] Univ Calif Berkeley, Dept EECS, Berkeley, CA USA
[2] IIT Kanpur, Kanpur, Uttar Pradesh, India
[3] URV, Madrid, Spain
[4] NTNU, Trondheim, Norway
关键词
AlGaN/GaN HEMTs; Compact models; Intermodulation distortion;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a physics based large signal RF compact model for Gallium Nitride HEMTs (GaN HEMTs). This surface-potential-based model is called Advance SPICE Model for GaN HEMT or ASM-GaN-HEMT model. Surface-potential (SP) in the triangular quantum well of GaN HEMTs is derived by solving Schrodinger's and Poisson's equations consistently and analytically. Core analytical drain-current model is derived using the developed SP model and drift-diffusion transport. The core model is enhanced with models for key real device effects to represent a real GaN HEMT device. A consistent intrinsic charge model is also derived from SP. The developed model is implemented in Verilog-A. Excellent model agreement with DC, S-parameters and large signal RF power sweep measurements are shown for a GaN HEMT device with width W = 40 mu m and number of fingers NF = 8.
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页数:4
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