Computer-aided crystallographic analysis in the TEM

被引：0
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作者：
Zaefferer, S [1 ]
机构：
[1] Max Planck Inst Iron Res, D-40237 Dusseldorf, Germany
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 125 | 2002年 / 125卷
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中图分类号：
O59 [应用物理学];
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页码：355 / 415
页数：73
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