Guest Editorial: Analog, Mixed-Signal and RF Testing

被引：1
|
作者：
Barragan, Manuel J. [1 ]
Eisenstadt, William R. [2 ]
机构：
[1] Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France
[2] Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2017年 / 33卷 / 03期
关键词：
D O I：
10.1007/s10836-017-5663-z
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：281 / 282
页数：2
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