Label-free protein and pathogen detection using the atomic force microscope

被引:26
|
作者
Huff, JL
Lynch, MP
Nettikadan, S
Johnson, JC
Vengasandra, S
Henderson, E
机构
[1] Bioforce Nanosci Inc, Ames, IA 50014 USA
[2] Des Moines Univ, Dept Microbiol, Des Moines, IA USA
[3] Iowa State Univ, Dept GDCB, Ames, IA USA
[4] Univ Space Res Assoc, Lyndon B Johnson Space Ctr, Houston, TX USA
关键词
atomic force microscope; nanoarray; virus detection; label-free detection;
D O I
10.1177/1087057104268803
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
The atomic force microscope (AFM) uses a sharp micron-scale tip to scan and amplify surface features, providing exceptionally detailed topographical information with magnification on the order of x 10(6). This instrument is used extensively for quality control in the computer and semiconductor industries and is becoming a progressively more important tool in the biological sciences. Advantages of the AFM for biological application include the ability to obtain information in a direct, label-free manner and the ability to image in solution, providing real-time data acquisition under physiologically relevant conditions. A novel application of the AFM currently under development combines its surface profiling capabilities with fixed immunocapture using antibodies immobilized in a nanoarray formal. This provides a distinctive platform for direct, label-free detection and characterization of viral particles and other pathogens.
引用
收藏
页码:491 / 497
页数:7
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