Built-in self-test with an alternating output

被引：4

作者：

Bogue, T ^{[1
]}

Gossel, M ^{[1
]}

Jurgensen, H ^{[1
]}

Zorian, Y ^{[1
]}

机构：

[1] Univ Waterloo, Dept Comp Sci, Waterloo, ON N2L 3G1, Canada

来源：

DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/DATE.1998.655854

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This technique results in a higher fault coverage, improved fault diagnosis capability, a greater test autonomy in core-based designs, and early fault notification.

引用

页码：180 / 184

页数：5

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