Single-buffer-architectured coated conductor based on IBAD and PLD method

被引：0

作者：

Miyata, S. ^{[1
]}

Ibi, A.

Watanabe, T.

Takahashi, K.

Yamada, Y.

Shiohara, Y.

机构：

[1] Int Superconduct Technol Ctr, Superconduct Res Lab, Nagoya Coated Conductor Ctr, Nagoya, Aichi 4568587, Japan

[2] Int Superconduct Technol Ctr, Superconduct Res Lab, Div Superconducting Tapes & Wires, Tokyo 1350062, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2007年 / 17卷 / 02期

关键词：

biaxial texture; coated conductor; ion-beam assisted deposition; pulsed laser deposition; single buffer; YBCO;

D O I：

10.1109/TASC.2007.899084

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In order to lower the production costs of coated conductors based on the ion-beam assisted deposition (IBAD) and pulsed laser deposition (PLD) method, we examined a single-buffered architecture (REBCO/IBAD/Hastelloy) without a second buffer layer of CeO2. While all samples exhibited similar degrees of the textures, transport current properties were found to be strongly dependent on the REBCO layer and IBAD template materials. With a structure of Ag/PLD-GdBa2Cu3O7/IBAD-Gd2Zr2O7/Hastelloy, we obtained critical currents of 165 Amps (0.8 mu m-thick) and critical current densities of 3.4 MA/cm(2) (0.4 mu m-thick) for short-piece samples in standard four-probe de measurements.

引用

页码：3406 / 3408

页数：3

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