Theoretical study on the top- and enclosed-contacted single-layer MoS2 piezotronic transistors

被引:11
|
作者
Liu, Wei [1 ]
Zhou, Yongli [1 ]
Zhang, Aihua [1 ]
Zhang, Yan [2 ,3 ]
Wang, Zhong Lin [1 ,4 ]
机构
[1] Chinese Acad Sci, Natl Ctr Nanosci & Technol NCNST, Beijing Inst Nanoenergy & Nanosyst, Beijing 100083, Peoples R China
[2] Lanzhou Univ, Inst Theoret Phys, Lanzhou 730000, Peoples R China
[3] Lanzhou Univ, Key Lab Magnetism & Magnet Mat MOE, Lanzhou 730000, Peoples R China
[4] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
基金
中国国家自然科学基金;
关键词
D O I
10.1063/1.4948660
中图分类号
O59 [应用物理学];
学科分类号
摘要
Recently, the piezotronic effect has been observed in two-dimensional single-layer MoS2 materials, which have potential applications in force and pressure triggered or controlled electronic devices, sensors, and human-machine interfaces. However, classical theory faces the difficulty in explaining the mechanism of the piezotronic effect for the top-and enclosed-contacted MoS2 transistors, since the piezoelectric charges are assumed to exist only at the edge of the MoS2 flake that is far from the electronic transport pathway. In the present study, we identify the piezoelectric charges at the MoS2/metal-MoS2 interface by employing both the density functional theory and finite element method simulations. This interface is on the transport pathway of both top-and enclosed-contacted MoS2 transistors, thus it is capable of controlling their transport properties. This study deepens the understanding of piezotronic effect and provides guidance for the design of two-dimensional piezotronic devices. Published by AIP Publishing.
引用
收藏
页数:5
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