A practical method for modeling PCB transmission lines with conductor surface roughness and wideband dielectric properties

被引：51
|
作者：
Liang, Tao [1 ]
Hall, Stephen [1 ]
Heck, Howard [1 ]
Brist, Gary [1 ]
机构：
[1] Intel Corp, Hudson, MA 01749 USA
来源：
2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5 | 2006年
关键词：
conductor loss; Debye dielectric model; dielectric loss; PCB; printed circuit boards; surface roughness; transmission lines;
D O I：
10.1109/MWSYM.2006.249721
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper discusses the modeling techniques to account for transmission line high frequency effects, and proposes a method to integrate these techniques into a practical and design-worthy model generation flow. The frequency tabulated transmission line models are capable of predicting wideband dielectric characteristics and high frequency conductor losses due to skin effect and surface roughness. They can be used to accurately model high volume, low cost printed circuit board traces which often have roughened trace surfaces and pronounced frequency variation in dielectric properties. The model accuracy is verified up to 20 GHz in frequency domain, thus suitable for Multi-Gigabit signaling analysis.
引用
收藏
页码：1780 / +
页数：2
相关论文
共 50 条
  • [1] A Method to Extract Dielectric Parameters from Transmission Lines with Conductor Surface Roughness at Microwave Frequencies
    Huang, Binke
    Jia, Qi
    [J]. PROGRESS IN ELECTROMAGNETICS RESEARCH M, 2016, 48 : 1 - 8
  • [2] A corrected method to extract dielectric parameters from transmission lines with conductor surface roughness at terahertz frequencies
    [J]. Huang, Binke (bkhuang@mail.xjtu.edu.cn), 1600, Electromagnetics Academy (59):
  • [3] An Approach for Quantifying the Conductor and Dielectric Losses in PCB Transmission Lines
    Torres-Torres, Reydezel
    Vega-Gonzalez, Victor H.
    [J]. ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS, 2009, : 235 - 238
  • [4] A Method for Modeling the Impact of Conductor Surface Roughness on Waveguiding Properties of Interconnects
    Ma, Xiao
    Ochoa, Juan S.
    Cangellaris, Andreas C.
    [J]. 2013 IEEE 22ND CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2013, : 11 - 14
  • [5] Simple conductor roughness modeling for microstrip lines
    Huang, Binke
    Wang, Xubing
    Vandenbosch, Guy A. E.
    [J]. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2019, 61 (08) : 1999 - 2002
  • [6] A differential extrapolation method to extract dielectric parameters of PCB with roughened conductor surface
    Jia, Qi
    Huang, Binke
    [J]. Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University, 2015, 49 (08): : 11 - 16
  • [7] PCB Conductor Surface Roughness as a Layer with Effective Material Parameters
    Koledintseva, Marina Y.
    Razmadze, Alexander G.
    Gafarov, Aleksandr Y.
    De, Soumya
    Drewniak, James L.
    Hinaga, Scott
    [J]. 2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2012, : 138 - 143
  • [8] Surface Impedance Concept for Modeling Conductor Roughness
    Gold, G.
    Helmreich, K.
    [J]. 2015 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2015,
  • [9] Characterization of Transmission Lines on PCB from S-Parameters by Determining the Dielectric and Conductor Losses at the Crossover Frequency
    Teran-Bahena, Erika Y.
    Sejas-Garcia, Svetlana C.
    Torres-Torres, Reydezel
    [J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 8 (05): : 867 - 874
  • [10] On the Modeling, Characterization, and Analysis of the Current Distribution in PCB Transmission Lines With Surface Finishes
    Curran, Brian
    Fotheringham, Gerhard
    Tschoban, Christian
    Ndip, Ivan
    Lang, Klaus-Dieter
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2016, 64 (08) : 2511 - 2518
12345