Logic Gates Based on Carbon Nanotube Field-Effect Transistors with SiNx Passivation Films

被引:8
|
作者
Kishimoto, Takaomi [1 ]
Ohno, Yasuhide [1 ]
Maehashi, Kenzo [1 ]
Inoue, Koichi [1 ]
Matsumoto, Kazuhiko [1 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
基金
日本科学技术振兴机构;
关键词
SINGLE; CIRCUITS; DEVICES;
D O I
10.1143/JJAP.49.06GG02
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrated logic gates based on complementary carbon nanotube field-effect transistors (CNT-FETs) with SiNx passivation films deposited by catalytic chemical vapor deposition. The carrier type of CNT-FETs was controlled by forming SiNx passivation films. Electrical measurements revealed that the p-type characteristics of CNT-FETs were converted to n-type characteristics after the deposition of SiNx passivation films. Then, the n-type CNT-FETs with SiNx passivation films were reconverted to p-type CNT-FETs by annealing in N-2 atmosphere. As a consequence, complementary voltage inverters comprising p-and n-type CNT-FETs with SiNx passivation films were demonstrated on the same SiO2 substrate by conventional photolithography and lift-off techniques. Moreover, the static transfer and dynamic characteristics of the CNT-FET-based inverters were investigated. It was found that a gain of approximately 3 was achieved and that the device was switched properly at frequencies of up to 100 Hz. (C) 2010 The Japan Society of Applied Physics
引用
收藏
页码:06GG021 / 06GG024
页数:4
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