Progress on a Surface-Electrode Ion Trap for Optical Frequency Metrology

被引：0
|
作者：
Delehaye, M. [1 ]
Kersale, Y. [1 ]
Lacroute, C. [1 ]
Groult, L. [1 ]
Laupretre, T. [1 ]
Kumar, A. [1 ]
Achi, B. [1 ]
Souidi, M. [1 ]
Bigler, E. [1 ]
Millo, J. [1 ]
Bourgeois, P-Y [1 ]
机构：
[1] Univ Bourgogne Franche Comte, CNRS, ENSMM, FEMTO ST Inst, Besancon, France
来源：
PROCEEDINGS OF THE 2019 JOINT CONFERENCE OF THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM AND EUROPEAN FREQUENCY AND TIME FORUM (EFTF-IFCS 2019) | 2019年
关键词：
ion optical clock; surface-electrode trap; time and frequency metrology; GENERATION;
D O I：
10.1109/fcs.2019.8856116
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
We present our latest results obtained with a surface-electrode ion trap designed for optical frequency metrology. A prototype trap, based on a simple geometry realized on a printed-circuit board, has been successfully used to trap single Yb+ ions. Our long-term goal is the realization of a compact single-ion optical clock.
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页数：2
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