Use of ultra-thin aluminum oxide layer to reduce photoluminescence decay in poly(p-phenylene vinylene) films

被引：1

作者：

Gedelian, Cynthia A. ^{[1
]}

Ou, Ya ^{[1
]}

Li, Huafang ^{[1
]}

Lu, Toh-Ming ^{[1
]}

机构：

[1] Rensselaer Polytech Inst, Ctr Integrated Elect, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 15期

关键词：

Poly(p-phenylene vinylene); Aluminum oxide; Photoluminescence; Transmission electron microscopy; Degradation; CONJUGATED POLYMERS; VAPOR-DEPOSITION; ENHANCEMENT; DEGRADATION;

D O I：

10.1016/j.tsf.2010.01.031

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The degradation of conjugated polymer poly(p-phenylene vinylene) (PPV) in the atmosphere upon exposure to ultraviolet light limits its applications as the emitting layer in organic light emitting diodes. In this paper we show that a thin layer of aluminum oxide around 10 nm in thickness prevents photoluminescence degradation of PPV during exposure to blue light in the atmosphere but not at lower excitation wavelengths. This oxide film is free of cracks and pinholes from transmission electron microscopy analysis. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：4367 / 4369

页数：3

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