LOW SIDE GAN FET DRIVER FOR SPACE APPLICATIONS

被引:2
|
作者
Mansilla, O. E. [1 ]
Broline, J. [1 ]
Satterfied, H. [1 ]
Pearce, L. G. [1 ]
Thomson, E. J. [1 ]
机构
[1] Intersil Corp, 1650 Robert J Conlan BLVD, Palm Bay, FL 32905 USA
来源
关键词
D O I
10.1051/e3sconf/20171612006
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This paper reports the results of preliminary single event effects (SEE) testing of the Intersil ISL70040SEH, a single low side driver specifically designed to drive enhancement mode power GaN FETs.
引用
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页数:4
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