Optimal grid pattern for automated camera calibration using cross ratio

被引：0

作者：

Matsunaga, C ^{[1
]}

Kanazawa, Y

Kanatani, K

机构：

[1] FOR A Co Ltd, Broadcast Div, Sakura 2850802, Japan

[2] Toyohashi Univ Technol, Dept Knowledgebased Informat Engn, Toyohashi, Aichi 4418580, Japan

[3] Gunma Univ, Dept Comp Sci, Kiryu, Gumma 3768515, Japan

来源：

IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES | 2000年 / E83A卷 / 10期

关键词：

cross ratio; Markov process; error analysis; reliability evaluation; virtual studio;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

With a view to virtual studio applications, we design an optimal grid pattern such that the observed image of a small portion of it can be matched to its corresponding position in the pattern easily. The grid shape is so determined that the cross ratio of adjacent intervals is different everywhere. The cross ratios are generated by an optimal Markov process that maximizes the accuracy of matching. We test our camera calibration system using the resulting grid pattern in a realistic setting and show that the performance is greatly improved by applying techniques derived from the designed properties of the pattern.

引用

页码：1921 / 1928

页数：8

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