Electrical Characteristics of Au/PVA (x-doped)/n-Si: Comparison Study on the Effect of Dopant Type in PVA

The main propose of this study is to investigate whether the doppant material in PVA would change the electrical characteristics of Au/PVA (X-doped) n-Si Schottky structure. Therefore, Au/PVA (Co, Zn-doped) n-Si (D1) and /PVA (Co, Ni-doped) n-Si (D2) Schottky structures were fabricated under the same condition using n-type (phosphor-doped) single crystal silicon wafer with (111) surface orientation. After the PVA/(Co-Zn) and PVA/(Co-Ni) acetates was obtained, the nanofiber film was fabricated on the silicon wafer by the use of an electrospinning technique. The results indicated that the electrical parameters of Au/PVA (x-doped) n-Si Schottky structure were significantly influenced from the doppant material in PVA. Comparative results on electrical parameters of D1 and D2 were reported in this study.