We evaluate the power of the sample entropy goodness-of-fit tests for s-normal, exponential, and uniform distributions. We compare them with the mainstream statistical tests, the W test based on the best linear unbiased estimator (BLUE) of the location parameter, the Z test based on the sample spacings, and the R test based on the correlation coefficient between the order statistics of the sample & the corresponding population quantiles. We show that the latter are more powerful overall. The, mainstream statistical tests, particularly the Z test, readily extend to censored samples and to multi-sample situations.
机构:
IIMAS UNAM, Dept Probabil & Stat, Apdo Postal 20-126, Mexico City 01000, DF, MexicoIIMAS UNAM, Dept Probabil & Stat, Apdo Postal 20-126, Mexico City 01000, DF, Mexico
Contreras-Cristan, A.
Gutierrez-Pena, E.
论文数: 0引用数: 0
h-index: 0
机构:
IIMAS UNAM, Dept Probabil & Stat, Apdo Postal 20-126, Mexico City 01000, DF, MexicoIIMAS UNAM, Dept Probabil & Stat, Apdo Postal 20-126, Mexico City 01000, DF, Mexico
Gutierrez-Pena, E.
Walker, S. G.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Texas Austin, Dept Math, Austin, TX 78712 USA
Univ Texas Austin, Dept Stat & Data Sci, Austin, TX 78712 USAIIMAS UNAM, Dept Probabil & Stat, Apdo Postal 20-126, Mexico City 01000, DF, Mexico