Optical properties of ultra-thin metal films

被引：0
|
作者：
Gompf, B. [1 ]
Brandt, T. [1 ]
Beister, J. [1 ]
Dressel, M. [1 ]
Drichko, N. [1 ]
机构：
[1] Univ Stuttgart, Inst Phys, Pfaffenwaldring 57, D-70550 Stuttgart, Germany
来源：
CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2006年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
While the optical properties as well as the DC-conductivity of thicker metal films are well understood, little has been done at and below the metal-to-insulator transition (percolation threshold), especially in the infrared and far-infrared region. Here we present temperature dependent FTIR measurements on ultra-thin Au films on Si(111) in the thickness range between about one monolayer and 9nm.
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页码：468 / 468
页数：1
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