Nanoscale Imaging with Soft X-Ray Lasers

被引：1

作者：

Menoni, C. S. ^{[1
,2
]}

Nejdl, J. ^{[1
,4
]}

Monserud, N. ^{[1
,2
]}

Howlett, I. D. ^{[1
,2
]}

Carlton, D. ^{[1
,3
]}

Anderson, E. H. ^{[1
,3
]}

Chao, W. ^{[1
,3
]}

Marconi, M. C. ^{[1
,3
]}

Rocca, J. J. ^{[1
,3
]}

机构：

[1] Colorado State Univ, Natl Sci Fdn, Engn Res Ctr Extreme Ultraviolet Sci & Technol, Ft Collins, CO 80523 USA

[2] Colorado State Univ, Elect & Comp Engn, Ft Collins, CO 80523 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

[4] Inst Phys AS CR, ELI Beamlines Project, Prague, Czech Republic

来源：

X-RAY LASERS 2014 | 2016年 / 169卷

关键词：

REPETITION-RATE; COMPACT; EUV;

D O I：

10.1007/978-3-319-19521-6_34

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes recent advances in full field aerial soft x-ray (SXR) laser microscopes. It also shows these microscopes can be readily configured into a differential holographic microscopy (DHM) geometry to acquire image plane holograms from which amplitude and phase of the object wave are obtained. The ability to quantitatively determine phase is critical at SXR wavelengths when the absorption contrast is low.

引用

页码：259 / 265

页数：7

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