Total-Ionizing-Dose induced degradation of several quartz oscillators

被引：0
|
作者：
Demidova, Alexandra, V
Koroteev, Mikhail E.
Zavorotnov, Dmitry, V
Boychenko, Dmitry, V
机构：
来源：
2018 18TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2018年
关键词：
Epson; XSIS; quartz oscillators; Rad-Hard crystal topology; TID; Total Ionizing Dose;
D O I：
10.1109/RADECS45761.2018.9328714
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The influence of TID on several types of XSIS and Epson quartz oscillators has been studied Parameters of quartz resonator don't change much until functionality fails. It's recommended to check the OE or ST signal.
引用
收藏
页码：312 / 314
页数：3
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