Radiation Test Results of Candidate Spacecraft Parts for the Applied Physics Laboratory

被引：2
|
作者：
Tipton, Alan D. [1 ]
Pham, Chi H. [1 ]
Maurer, Richard H. [1 ]
Roth, David R. [1 ]
机构：
[1] Johns Hopkins Univ, Dept Space, Appl Phys Lab, Laurel, MD 20703 USA
来源：
2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 2009年
关键词：
total ionizing dose; single event effects; single event latchup; single event functional interrupt; digital-to-analog converters; digital synthesizer;
D O I：
10.1109/REDW.2009.5336316
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The radiation responses of candidate spacecraft digital-to-analog converters (DACs) and digital synthesizers are presented. Candidate electronics are evaluated for total ionizing dose and single event effects.
引用
收藏
页码：39 / 41
页数：3
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