Identifying critical success factors in EDA industry using DEMATEL method

被引:11
|
作者
Sun, Chia-Chi [1 ,2 ]
机构
[1] Tamkang Univ, Grade Inst, New Taipei City, Taiwan
[2] Tamkang Univ, Dept Int Business, New Taipei City, Taiwan
关键词
Critical Success Factors; Diamond mode; EDA industry; Mu1tiple criteria decision-making (MCDM); Decision Making Trial and Evaluation Laboratory (DEMATEL); CRITERIA; MODEL;
D O I
10.1080/18756891.2015.1001945
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Electronic design automation (EDA) is a category of software tools for designing electronic systems such as printed circuit boards and integrated circuits. However, the EDA industry has been locked into virtually flat growth for the past several years. Time-to-market pressures and design complexity are critical challenges that EDA industry face today. With this background, this paper attempts to identify and analyze the Critical Success Factors (CSFs) in EDA industry. This research proposes the decision making trial and evaluation laboratory (DEMATEL) as the main analytical tool. The DEMATEL can be used as an effective method to handle the inner dependences within a set of criteria. Results show that the critical local demand condition and government are the causal competitive advantage factors for the EDA industry and could have the significant role in responding to the EDA industry. This paper draws on the research results for managerial practice implications and suggests some empirical tactics to enhance management performance for the EDA industry.
引用
收藏
页码:208 / 218
页数:11
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