Nanostructure and atomic structure of glass seen by atomic force microscopy

被引:31
|
作者
Frischat, GH [1 ]
Poggemann, JF [1 ]
Heide, G [1 ]
机构
[1] Tech Univ Clausthal, Inst Nichtmet Werkstoffe, D-38678 Clausthal Zellerfeld, Germany
关键词
D O I
10.1016/j.jnoncrysol.2004.08.022
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Differently prepared SiO2, Na2O-SiO2, and Duran borosilicate glass surfaces were imaged by atomic force microscopy (AFM), both with an air-AFM and an ultra-high vacuum-AFM. The images of both microscopes display a nanostructure of SiO2 glass with a ripple pattern and a domain pattern, respectively, with coinciding sizes of several 10 nm. These domains show clusters of greater than or equal to 1 nm in diameter, in accordance with Bruckner's SiO2 glass model of preordered regions. Inspecting glass fracture surfaces, prepared and imaged under ultra-high vacuum conditions, reveals structural features like interatomic distances, groupings of atoms, network holes, distribution of atomic distances, percolation paths, and topological connectivities of the glass structures. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:197 / 202
页数:6
相关论文
共 50 条
  • [21] The surface nanostructure features of ovarian cancer cells by atomic force microscopy
    Si, Xiaoxia
    Gao, Hanxing
    Tang, Xiaoqiong
    Yang, Hongqin
    Wang, Yuhua
    [J]. SPIE-CLP CONFERENCE ON ADVANCED PHOTONICS 2022, 2023, 12601
  • [22] Impact of Parameter Variation in Fabrication of Nanostructure by Atomic Force Microscopy Nanolithography
    Dehzangi, Arash
    Larki, Farhad
    Hutagalung, Sabar D.
    Naseri, Mahmood Goodarz
    Majlis, Burhanuddin Y.
    Navasery, Manizheh
    Hamid, Norihan Abdul
    Noor, Mimiwaty Mohd
    [J]. PLOS ONE, 2013, 8 (06):
  • [23] Monitoring of glass derivatization with pulsed force mode atomic force microscopy
    Ebner, A
    Kienberger, F
    Stroh, CM
    Gruber, HJ
    Hinterdorfer, P
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2004, 65 (4-5) : 246 - 251
  • [24] Atomic force Microscopy
    Perkel, JM
    [J]. SCIENTIST, 2006, 20 (07): : 68 - 68
  • [25] Atomic Force Microscopy
    Bellon, Ludovic
    [J]. PHYSICS TODAY, 2020, 73 (05) : 57 - 58
  • [26] Atomic force microscopy
    West, P
    Starostina, N
    [J]. ADVANCED MATERIALS & PROCESSES, 2004, 162 (02): : 35 - 37
  • [27] Atomic force microscopy
    Diaspro, A
    Rolandi, R
    [J]. IEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINE, 1997, 16 (02): : 26 - 27
  • [28] Atomic force microscopy
    Wright-Smith, C
    Smith, CM
    [J]. SCIENTIST, 2001, 15 (02): : 23 - 24
  • [29] Atomic force microscopy
    Damjanovich, S
    Mátyus, L
    [J]. CYTOMETRY, 2000, 42 (02): : 128 - 128
  • [30] ATOMIC FORCE MICROSCOPY
    FUJII, T
    YAMADA, H
    NAKAYAMA, K
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (03): : 197 - 197