Theoretical study of intrinsic defects in cubic silicon carbide 3C-SiC

被引:16
|
作者
Schultz, Peter A. [1 ]
Van Ginhoven, Renee M. [2 ]
Edwards, Arthur H. [3 ]
机构
[1] Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA
[2] Air Force Res Lab, Directed Energy Directorate, Kirtland AFB, NM 87117 USA
[3] Air Force Res Lab, Space Vehicles Directorate, Kirtland AFB, NM 87117 USA
关键词
JAHN-TELLER DISTORTIONS; SPIN-STATE; ELECTRONIC-STRUCTURE; FORMATION ENERGIES; NATIVE DEFECTS; BAND-STRUCTURE; POINT-DEFECTS; VACANCY; 3C; 2H;
D O I
10.1103/PhysRevB.103.195202
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using the local moment counter charge (LMCC) method to accurately represent the asymptotic electrostatic boundary conditions within density functional theory supercell calculations, we present a comprehensive analysis of the atomic structure and energy levels of point defects in cubic silicon carbide (3C-SiC). Finding that the classical long-range dielectric screening outside the supercell induced by a charged defect is a significant contributor to the total energy. we describe and validate a modified Jost screening model to evaluate this polarization energy. This leads to bulk-converged defect levels in finite size supercells. With the LMCC boundary conditions and a standard Perdew-Burke-Ernzerhof (PBE) exchange correlation functional, the computed defect level spectrum exhibits no band gap problem: the range of defect levels spans similar to 2.4 eV, an effective defect band gap that agrees with the experimental band gap. Comparing with previous literature, our LMCC-PBE defect results are in consistent agreement with the hybrid-exchange functional results of Oda et al. [J. Chem. Phys. 139, 124707 (2013)] rather than their PBE results. The difference with their PBE results is attributed to their use of a conventional jellium approximation rather than the more rigorous LMCC approach for handling charged supercell boundary conditions. The difference between standard DFT and hybrid functional results for defect levels lies not in a band gap problem but rather in solving a boundary condition problem. The LMCC-PBE entirely mitigates the effect of the band gap problem on defect levels. The more computationally economical PBE enables a systematic exploration of 3C-SiC defects, where, most notably, we find that the silicon vacancy undergoes Jahn-Teller-induced distortions from the previously assumed T-d symmetry, and that the divacancy, like the silicon vacancy, exhibits a site-shift bistability in p-type conditions.
引用
收藏
页数:18
相关论文
共 50 条
  • [31] Carbon as an acceptor in cubic GaN/3C-SiC
    Zado, A.
    Tschumak, E.
    Gerlach, J. W.
    Lischka, K.
    As, D. J.
    JOURNAL OF CRYSTAL GROWTH, 2011, 323 (01) : 88 - 90
  • [32] 3C-SiC pseudosubstrates for the growth of cubic GaN
    Aboughé-Nzé, P.
    Chassagne, T.
    Chaussende, D.
    Monteil, Y.
    Cauwet, F.
    Bustarret, E.
    Deneuville, A.
    Bentoumi, G.
    Martinez-Guerrerro, E.
    Daudin, B.
    Feuillet, G.
    Materials Science Forum, 2000, 338
  • [33] RELATIVISTIC ELECTRONIC-STRUCTURE, EFFECTIVE MASSES, AND INVERSION-ASYMMETRY EFFECTS OF CUBIC SILICON-CARBIDE (3C-SIC)
    WILLATZEN, M
    CARDONA, M
    CHRISTENSEN, NE
    PHYSICAL REVIEW B, 1995, 51 (19): : 13150 - 13161
  • [34] Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)
    Kemper, R. M.
    Haeberlen, M.
    Schupp, T.
    Weinl, M.
    Buerger, M.
    Ruth, M.
    Meier, C.
    Niendorf, T.
    Maier, H. J.
    Lischka, K.
    As, D. J.
    Lindner, J. K. N.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 9, NO 3-4, 2012, 9 (3-4): : 1028 - 1031
  • [35] Permittivity-Frequency Dependencies Study of Neutron-Irradiated Nanocrystalline Silicon Carbide (3C-SiC)
    Huseynov, Elchin M.
    NANO, 2017, 12 (06)
  • [36] Freestanding 3C-SiC grown by sublimation epitaxy using 3C-SiC templates on silicon
    Hens, P.
    Mueller, J.
    Wagner, G.
    Liljedahl, R.
    Yakimova, R.
    Spiecker, E.
    Wellmann, P.
    Syvajarvi, M.
    SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2, 2012, 717-720 : 177 - +
  • [37] Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)
    Kemper, R.M.
    Häberlen, M.
    Schupp, T.
    Weinl, M.
    Bürger, M.
    Ruth, M.
    Meier, C.
    Niendorf, T.
    Maier, H.J.
    Lischka, K.
    As, D.J.
    Lindner, J.K.N.
    Physica Status Solidi (C) Current Topics in Solid State Physics, 2012, 9 (3-4): : 1028 - 1031
  • [38] Study of 3C-SiC crystal defects by microbeam channeling methods
    1600, Elsevier Science B.V., Amsterdam, Netherlands (104): : 1 - 4
  • [39] Interface defects in n-type 3C-SiC/SiO2:: An EPR study of oxidized porous silicon carbide single crystals
    von Bardeleben, HJ
    Cantin, JL
    Ke, L
    Shishkin, Y
    Devaty, RP
    Choyke, WJ
    SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 273 - 276
  • [40] STUDY OF 3C-SIC CRYSTAL DEFECTS BY MICROBEAM CHANNELING METHODS
    SEKIGUCHI, H
    NISHIJIMA, T
    NASHIYAMA, I
    MISAWA, S
    YOSHIDA, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 104 (1-4): : 566 - 570