Measurement of falling film thickness around a horizontal tube using a laser measurement technique

被引:101
|
作者
Gstoehl, D [1 ]
Roques, JF [1 ]
Crisinel, P [1 ]
Thome, JR [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Fac Engn Sci & Tech, Lab Heat & Mass Transfer, CH-1015 Lausanne, Switzerland
关键词
D O I
10.1080/01457630490519899
中图分类号
O414.1 [热力学];
学科分类号
摘要
A new optical method for the non-intrusive measurement of falling film thickness on the perimeter of horizontal tubes is described. The technique uses a high-speed digital video camera to capture the images of the liquid interface that are illuminated by a laser sheet, with the contrast enhanced by a fluorescent powder in the fluid. The results are compared to those predicted by the Nusselt falling film theory, showing relatively good agreement around the upper perimeter of the tube but much poorer agreement on the lower perimeter. The corresponding effects on heat transfer have also been estimated.
引用
收藏
页码:28 / 34
页数:7
相关论文
共 50 条
  • [31] Measurement of liquid film thickness using a laser light absorption method
    A. A. Mouza
    N. A. Vlachos
    S. V. Paras
    A. J. Karabelas
    Experiments in Fluids, 2000, 28 : 355 - 359
  • [32] Film thickness and wave velocity measurement using reflected laser intensity
    ABCM, Brazil
    不详
    J. Braz. Soc. Mech. Sci. Eng., 2006, 1 (30-36):
  • [33] POLYMER FILM THICKNESS MEASUREMENT USING LASER-ULTRASOUND TECHNIQUES
    DEWHURST, RJ
    NOUI, L
    SHAN, Q
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (06): : 1736 - 1742
  • [34] Measurement of liquid film thickness using a laser light absorption method
    Mouza, AA
    Vlachos, NA
    Paras, SV
    Karabelas, AJ
    EXPERIMENTS IN FLUIDS, 2000, 28 (04) : 355 - 359
  • [35] Heat transfer enhanced surfaces for horizontal tube falling film evaporator characterized using laser interferometry
    Ganesan, A. R.
    Mani, A.
    Maliackal, Akhil Krishnan
    APPLIED THERMAL ENGINEERING, 2022, 210
  • [36] Falling liquid film thickness measurement by an optical-electronic method
    Zhang, JT
    Wang, BX
    Peng, XF
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (04): : 1883 - 1886
  • [37] Fast Remaining Thickness Measurement Using a Laser Source Scanning Technique
    Salim, Muhammad Nor
    Hayashi, Takahiro
    Murase, Morimasa
    Ito, Toshihiro
    Kamiya, Shoji
    MATERIALS TRANSACTIONS, 2012, 53 (04) : 610 - 616
  • [39] Optical coherence tomography as film thickness measurement technique
    Manallah, Aissa
    Bouafia, Mohamed
    Meguellati, Said
    PHOTONICS, DEVICES, AND SYSTEMS VI, 2015, 9450
  • [40] Digital Moiré technique for thin film thickness measurement
    Su, Junhong
    Liu, Yichen
    Zhongguo Jiguang/Chinese Journal of Lasers, 2012, 39 (11):