Compositional heterogeneity in ceria-based mixed oxides observed by x-ray photoelectron spectroscopy

被引:6
|
作者
Graham, GW [1 ]
Roe, CL [1 ]
Haack, LP [1 ]
Straccia, AM [1 ]
机构
[1] Ford Res Lab, Dearborn, MI 48121 USA
关键词
Cerium compounds - Electron scattering - Oxidation - Phase separation - Surface structure - X ray photoelectron spectroscopy;
D O I
10.1116/1.582305
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
It is argued that compositional heterogeneity in certain reducible mixed oxides, like Ce1-xZrxO2, can be inferred from a variation in the metals ratio, as measured by x-ray photoelectron spectroscopy, between fully oxidized and partially reduced states of the oxide, provided that the characteristic linear dimension of the heterogeneity is at least as large as the typical electron inelastic mean-free path. The argument is supported by experimental results from two examples involving mixed phases, one in which the length scale is 100 nm and the other in which the domains are too small for detection by standard x-ray diffraction. (C) 2000 American Vacuum Society. [S0734-2101(00)01304-X].
引用
收藏
页码:1093 / 1095
页数:3
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