Measurement method of microwave surface resistance of high Tc superconductive thin films

被引：6
|
作者：
Zhang, YM [1 ]
Luo, ZX [1 ]
Yang, K [1 ]
Zhang, QS [1 ]
机构：
[1] Univ Elect Sci & Technol China, Microwave Ctr, Chengdu 610054, Peoples R China
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2003年 / 385卷 / 04期
关键词：
D O I：
10.1016/S0921-4534(02)02065-8
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A measurement system for characterization of microwave surface resistance of HTS thin films is presented. In this system, a high Q factor sapphire resonator probe with TE011+delta mode was developed to measure the surface resistance R-s of a single piece of HTS thin film at 12 GHz and 77 K. The size of HTS films can be equal to about 2 in. The method has advantages of nondestructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码：473 / 476
页数：4
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