Stimulated emission, electro- and photoluminescence of InGaN/GaN EL-test and SQW heterostructures grown by MOVPE

被引:0
|
作者
Yablonskii, GP
Lutsenko, EV
Marko, IP
Pavlovskii, VN
Mudryi, AV
Stognij, AI
Schön, O
Protzmann, H
Lünenbürger, M
Schineller, B
Heuken, M
Heime, K
机构
[1] AIXTRON AG, D-52072 Aachen, Germany
[2] Stepanov Inst Phys, Minsk 220072, BELARUS
[3] Inst Solid State & Semicond Phys, Minsk 220072, BELARUS
[4] Rhein Westfal TH Aachen, Inst Halbleitertech, D-52056 Aachen, Germany
关键词
D O I
10.1002/1521-396X(200007)180:1<149::AID-PSSA149>3.0.CO;2-J
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electroluminescence test and SQW InGaN/GaN heterostructures were characterised with electroluminescence. photoluminescence, photoluminescence excitation and stimulated emission spectroscopy. It was found that the electroluminescence emission from the heterostructure edge reveals leaking modes. Laser action under optical excitation was achieved up to room temperature in the SQW heterostructures which showed sharp photoluminescence excitation bands and, thus, a sufficiently homogeneous distribution of the In atoms in the quantum well. We suppose that one of the possible mechanisms of the yellow luminescence excitation in the QW structures is the energy transfer by tunneling of carriers from the electron states in the InGaN layers into the excited states responsible for the yellow luminescence in the GaN barriers.
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页码:149 / 155
页数:7
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