Analysis in wavefront propagation based on ray tracing for acquisition of aberration-corrected hologram

被引：0
|
作者：
Kim, Dongyeon [1 ]
Nam, Seung-Woo [1 ]
Lee, Byoungho [1 ]
机构：
[1] Seoul Natl Univ, Sch Elect & Comp Engn, Gwanak Gu Gwanakro 1, Seoul 08826, South Korea
来源：
ADVANCED OPTICAL IMAGING TECHNOLOGIES III | 2020年 / 11549卷
关键词：
Holographic display; aberration correction; vision correction; pupil swim; ANGLE;
D O I：
10.1117/12.2575605
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Holographic display is widely known for aberration correction capability. In this paper, we analyze the image quality degradation when aberration is present in the holographic display system. Though built with lenses with minimal aberrations, it is inevitable from undesirable error when perceived with an usual eye. Thus, we mainly analyze holographic image quality in two cases: when eye gets defocused and rotated. In simulation, accommodation-dependent schematic eye model is utilized for precise acquisition of aberration-corrected hologram. The hologram acquired with ray tracing is assessed with the bench-top prototype of holographic near-eye display.
引用
收藏
页数：6
相关论文
共 50 条
  • [1] Materials analysis by aberration-corrected STEM
    Krivanek, OL
    Bacon, NJ
    Corbin, GC
    Dellby, N
    McManama-Smith, A
    Murfitt, MF
    Nellist, PD
    Szilagyi, ZS
    Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure, 2005, 839 : 9 - 14
  • [2] A Bloch wave analysis of optical sectioning in aberration-corrected STEM
    Cosgriff, E. C.
    Nellist, P. D.
    ULTRAMICROSCOPY, 2007, 107 (08) : 626 - 634
  • [3] Wavefront aberration of cubic phase in propagation and order separation by computer generated hologram
    Optical Technology Research Center, Changchun Institute of Optics and Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
    不详
    不详
    Guangxue Jingmi Gongcheng, 2008, 11 (2104-2109):
  • [4] Full-field hard X-ray microscopy based on aberration-corrected Be CRLs
    Schropp, Andreas
    Brueckner, Dennis
    Bulda, Jessica
    Falkenberg, Gerald
    Garrevoet, Jan
    Hagemann, Johannes
    Seiboth, Frank
    Spiers, Kathryn
    Koch, Frieder
    David, Christian
    Gambino, Marianna
    Vesely, Martin
    Meirer, Florian
    Schroer, Christian G.
    X-RAY NANOIMAGING: INSTRUMENTS AND METHODS IV, 2019, 11112
  • [5] ABERRATION-CORRECTED STEM: TOWARDS THE ULTIMATE RESOLUTION FOR IMAGING AND ANALYSIS
    Pennycook, S. J.
    Lupini, A. R.
    Krivanek, L.
    Delby, N.
    Nellist, P. D.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C252 - C252
  • [6] Aberration-corrected STEM for atomic-resolution imaging and analysis
    Krivanek, O. L.
    Lovejoy, T. C.
    Dellby, N.
    JOURNAL OF MICROSCOPY, 2015, 259 (03) : 165 - 172
  • [7] Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses
    Seiboth, Frank
    Wittwer, Felix
    Scholz, Maria
    Kahnt, Maik
    Seyrich, Martin
    Schropp, Andreas
    Wagner, Ulrich
    Rau, Christoph
    Garrevoet, Jan
    Falkenberg, Gerald
    Schroer, Christian G.
    JOURNAL OF SYNCHROTRON RADIATION, 2018, 25 : 108 - 115
  • [8] Wavelet image analysis in aberration-corrected scanning transmission electron microscopy
    Ramasse, QM
    Bleloch, AL
    ELECTRON MICROSCOPY AND ANALYSIS 2003, 2004, (179): : 341 - 344
  • [9] Aberration-Corrected STEM Analysis of a Cubic Cd Array Encapsulated in Zeolite A
    Mayoral, Alvaro
    Readman, Jennifer E.
    Anderson, Paul A.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2013, 117 (46): : 24485 - 24489
  • [10] Membrane-based, aberration-corrected tunable micro-lenses
    Waibel, Philipp
    Ermantraut, Eugen
    Mader, Daniel
    Zappe, Hans
    Seifert, Andreas
    MICRO-OPTICS 2010, 2010, 7716
12345