Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

To date, compound refractive X-ray lenses made out of Beryllium (Be CRLs) have been seldom applied for full-field microscopy with high spatial resolution, which was probably due to residual aberrations of these optics. However, in combination with the recent development of made-to-measure phase plates, the typical spherical aberration of beryllium compound refractive lenses (Be CRLs) can now be completely removed. In this way, distortion-free images of a sample are obtained, which is especially important for tomographic applications. First full-field imaging experiments with aberration-corrected Be CRLs were carried out at beamline P06 at the synchrotron radiation X-ray source PETRA III (DESY Hamburg, Germany). In order to maximize the magnification of the X-ray microscope for full-field microscopy, the full length of the beamline combining the micro- and nanohutch was utilized, enabling a large sample-to-detector distance. In this contribution, we present first imaging results, demonstrating the potential of Be CRLs for direct high-resolution X-ray tomography.