In-situ Measurement and Characterization of Crystal Growth by X-ray Diffraction

被引：0
|
作者：
Beckers, Detlef [1 ]
Munk, Peter [1 ]
机构：
[1] PANalytical BV, Almelo, Netherlands
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
关键词：
crystallization; in-situ; morphology;
D O I：
10.1107/S0108767311088453
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS35.P10
引用
收藏
页码：C459 / C459
页数：1
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