Discrimination of dendrimer aggregates on mica based on adhesion force:: A pulsed force mode atomic force microscopy study

被引:31
|
作者
Zhang, H
Grim, PCM
Vosch, T
Wiesler, UM
Berresheim, AJ
Müllen, K
De Schryver, FC
机构
[1] Katholieke Univ Leuven, Dept Chem, Lab Mol Dynam & Spect, B-3001 Heverlee, Belgium
[2] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
关键词
D O I
10.1021/la0008378
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)(16) and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)(16) and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated.
引用
收藏
页码:9294 / 9298
页数:5
相关论文
共 50 条
  • [1] Monitoring of glass derivatization with pulsed force mode atomic force microscopy
    Ebner, A
    Kienberger, F
    Stroh, CM
    Gruber, HJ
    Hinterdorfer, P
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2004, 65 (4-5) : 246 - 251
  • [2] Chemical force microscopy of SAMs by adhesive force mapping with pulsed-force-mode atomic force microscopy.
    Fujihira, M
    Okui, H
    Akiba, U
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U315 - U315
  • [3] ADHESION FORCE IMAGING IN AIR AND LIQUID BY ADHESION MODE ATOMIC-FORCE MICROSCOPY
    VANDERWERF, KO
    PUTMAN, CAJ
    DEGROOTH, BG
    GREVE, J
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (09) : 1195 - 1197
  • [4] Liposome adhesion on mica surface studied by atomic force microscopy
    Egawa, H
    Furusawa, K
    [J]. LANGMUIR, 1999, 15 (05) : 1660 - 1666
  • [5] Determination of the hydrophilic character of membranes by pulsed force mode atomic force microscopy
    Meincken, M
    Roux, SP
    Jacobs, EP
    [J]. APPLIED SURFACE SCIENCE, 2005, 252 (05) : 1772 - 1779
  • [6] Application of atomic force microscopy in adhesion force measurements
    Sadegh Hassani, Sedigheh
    Daraee, Maryam
    Sobat, Zahra
    [J]. Journal of Adhesion Science and Technology, 2021, 35 (03): : 221 - 241
  • [7] Application of atomic force microscopy in adhesion force measurements
    Hassani, Sedigheh Sadegh
    Daraee, Maryam
    Sobat, Zahra
    [J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2021, 35 (03) : 221 - 241
  • [8] ATOMIC FORCE MICROSCOPY FOR THE STUDY OF TRIBOLOGY AND ADHESION
    MEYER, E
    HEINZELMANN, H
    GRUTTER, P
    JUNG, T
    HIDBER, HR
    RUDIN, H
    GUNTHERODT, HJ
    [J]. THIN SOLID FILMS, 1989, 181 : 527 - 544
  • [9] A study of adhesion forces by atomic force microscopy
    Jacquot, C
    Takadoum, J
    [J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2001, 15 (06) : 681 - 687
  • [10] Observation of the mica surface by atomic force microscopy
    Liu, ZG
    Li, Z
    Zhou, HL
    Wei, G
    Song, YH
    Wang, L
    [J]. MICRON, 2005, 36 (06) : 525 - 531