Multilocalization of interference fringes in the Mach-Zender interferometer

被引：0
|
作者：
Simon, JM [1 ]
Echarri, R [1 ]
Walsh, PA [1 ]
机构：
[1] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, Lab Opt, RA-1428 Buenos Aires, DF, Argentina
来源：
OPTIK | 2000年 / 111卷 / 07期
关键词：
interferometers; fringe localization;
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The phenomenon of multiple localization in a Mach-Zender interferometer illuminated by a system of incoherent equidistant linear sources is studied. The relation between multilocalization and diffraction at a grating of period equal to the spacing between the sources composing the illumination system is analysed. Using the former relation an adjustment method is developed for interferometers of separated beams. This method enables the interference fringes at the different focalization planes to be seen without readjusting the alignment. This enables to observe perturbations at different planes with the pimple focalization of the camera.
引用
收藏
页码：307 / 309
页数：3
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