Imaging interferometric microscopy - approaching the linear systems limits of optical resolution

被引:77
|
作者
Kuznetsova, Yuliya
Neumann, Alexander
Brueck, S. R. J.
机构
[1] Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87131 USA
[2] Univ New Mexico, Dept Phys, Albuquerque, NM 87131 USA
[3] Univ New Mexico, Dept Astron, Albuquerque, NM 87131 USA
[4] Univ New Mexico, Dept Elect & Comp Engn, Albuquerque, NM 87131 USA
关键词
D O I
10.1364/OE.15.006651
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The linear systems optical resolution limit is a dense grating pattern at a lambda/2 pitch or a critical dimension (resolution) of lambda/4. However, conventional microscopy provides a (Rayleigh) resolution of only similar to 0.68/NA, approaching lambda/1.67 as NA. 1. A synthetic aperture approach to reaching the lambda/4 linear-systems limit, extending previous developments in imaging-interferometric microscopy, is presented. Resolution of non-periodic 180-nm features using 633-nm illumination (lambda/3.52) and of a 170-nm grating (lambda/3.72) is demonstrated. These results are achieved with a 0.4-NA optical system and retain the working distance, field-of-view, and depth-of-field advantages of low-NA systems while approaching ultimate resolution limits. (C) 2007 Optical Society of America.
引用
收藏
页码:6651 / 6663
页数:13
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