Mueller matrix measurements were used to characterize the polarization properties of liquid crystal-based reflective type twisted nematic (TN) special light modulator (SLM) at oblique incidence of the laser beam. The experimentally obtained Mueller matrices were used to obtain the combination of polarization optics required to optimize it for phase only modulation. The results indicate that minimum intensity modulation is obtained with the use of a polarizer followed by a quarter wave plate (QWP) in polarization state generator (PSG) arm and a QWP followed by an analyzer in polarization state analyzer arm (PSA). Polarization parameters such as retardance, rotation and depolarization were calculated from the experimentally obtained Mueller matrices using polar decomposition method at different angle of incidences of the laser beam and the results has been discussed. The similarity between retardance and depolarization curve as a function of address voltage of TNSLM indicated that depolarization is mainly associated with errors in retardance values. Further, spectral Mueller matrix measurements were used to obtain intensity modulation response in the range of wavelengths 450-700 nm for broadband applications. (C) 2010 Elsevier B.V. All rights reserved.
机构:
Chonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Inst Photon & Informat Technol, Jeon Ju 561756, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Khos-Ochir, Tsogvoo
Munkhbaatar, Purevdorj
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Chonbuk Natl Univ, Dept Phys, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Inst Photon & Informat Technol, Jeon Ju 561756, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Munkhbaatar, Purevdorj
Yang, Byung Kwan
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Jiny Photon Co Ltd, Wan Ju 565854, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Yang, Byung Kwan
Kim, Hyun Woo
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Chonbuk Natl Univ, Dept Phys, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Inst Photon & Informat Technol, Jeon Ju 561756, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Kim, Hyun Woo
Kim, Jin Seung
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Chonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Dept Phys, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Inst Photon & Informat Technol, Jeon Ju 561756, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Kim, Jin Seung
Myung-Whun, Kim
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Chonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Dept Phys, Jeon Ju 561756, South Korea
Chonbuk Natl Univ, Inst Photon & Informat Technol, Jeon Ju 561756, South KoreaChonbuk Natl Univ, Dept Nanosci & Technol, Jeon Ju 561756, South Korea
机构:
State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of SciencesState Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences
机构:
Univ Buenos Aires, Dept Fis, FCEyN, Pabellon 1,Ciudad Univ, RA-1428 Buenos Aires, DF, Argentina
Consejo Nacl Invest Cient & Tecn, Buenos Aires, DF, ArgentinaUniv Buenos Aires, Dept Fis, FCEyN, Pabellon 1,Ciudad Univ, RA-1428 Buenos Aires, DF, Argentina
Bordakevich, Sebastian
Rebon, Lorena
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Univ Nacl La Plata, FCE, Dept Fis, CC 67, RA-1900 La Plata, Argentina
UNLP, CONICET, Inst Fis La Plata, La Plata, ArgentinaUniv Buenos Aires, Dept Fis, FCEyN, Pabellon 1,Ciudad Univ, RA-1428 Buenos Aires, DF, Argentina