Measurement of epitaxial misorientations and related effects in thin films of YBa2Cu3O7-δ grown on nominally (001)MgO substrates by pulsed laser deposition

被引:3
|
作者
Norris, DJ
Aindow, M
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Connecticut, Inst Sci Mat, Dept Met & Mat Engn, Storrs, CT 06269 USA
[3] Univ Birmingham, Sch Met & Mat, Birmingham B15 2TT, W Midlands, England
关键词
laser ablation; rutherford backscattering spectroscopy; superconductivity; surface morphology;
D O I
10.1016/S0040-6090(02)00999-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Heteroepitaxial YBa2Cu3O7-delta thin films have been deposited onto nominal (001)MgO substrates by pulsed laser deposition. For some of these films, Rutherford backscattering spectrometry analysis revealed anomalous variations in the backscattered yield at the substrate level during [001] YBa2Cu3O7-delta axial channelling. A novel angular-dependent ion channelling technique has been developed to investigate these effects. It has been shown that the anomalies arise from an epitaxial misorientation between the lattices of the substrate and deposit. Strong correlations were found between the magnitudes of the misorientations, the densities of spiral features on the deposit surface and the critical current densities exhibited by the deposits. It is proposed that the misorientation arises due to vicinal offcut of the substrate surface, which leads to a lower density of threading dislocations and hence less flux pinning. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:33 / 40
页数:8
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