Background-Force Compensation in Dynamic Atomic Force Microscopy

被引：5

作者：

Borgani, Riccardo ^{[1
]}

Thoren, Per-Anders ^{[1
]}

Forchheimer, Daniel ^{[1
]}

Dobryden, Illia ^{[2
]}

Sah, Si Mohamed ^{[1
]}

Claesson, Per Martin ^{[2
]}

Haviland, David B. ^{[1
]}

机构：

[1] KTH Royal Inst Technol, Nanostruct Phys, SE-10691 Stockholm, Sweden

[2] KTH Royal Inst Technol, Surface & Corros Sci, SE-10044 Stockholm, Sweden

来源：

PHYSICAL REVIEW APPLIED | 2017年 / 7卷 / 06期

基金：

瑞典研究理事会;

关键词：

D O I：

10.1103/PhysRevApplied.7.064018

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic force microscopy. We provide a mathematical derivation of a method to compensate for background forces, apply it to experimental data, and discuss how to include background forces in simulation. Our method, based on linear-response theory in the frequency domain, provides a general way of measuring and compensating for any background force and it can be readily applied to different force reconstruction methods in dynamic AFM.

引用

页数：8

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