Preamplifying cantilevers for dynamic atomic force microscopy

被引：10
|
作者：
Zeyen, Benedikt [1 ]
Virwani, Kumar [2 ]
Pittenger, Bede [2 ]
Turner, Kimberly L. [1 ]
机构：
[1] Univ Calif Santa Barbara, Dept Mech Engn, Santa Barbara, CA 93106 USA
[2] Veeco Metrol, Santa Barbara, CA 93117 USA
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 10期
基金：
美国国家科学基金会;
关键词：
atomic force microscopy; cantilevers; ferroelectric materials; harmonic oscillators; lithium compounds; THIN-FILMS; RESONANCES;
D O I：
10.1063/1.3093814
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A cantilever type has been developed for dynamic force microscopy by the addition of a harmonic oscillator in the form of a paddle to atomic force microscopy cantilevers. These cantilevers provide resonant amplification of periodic interactions between the probe and the substrate when the laser is aligned on the paddle. The cantilevers were explored for their use in piezoresponse force microscopy. Application of the cantilevers for measurements on periodically poled lithium niobate ferroelectric material is presented. A comparison with commonly used cantilevers showed an as good as or better performance of the presented cantilevers.
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页数：3
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