control chart;
discrimination;
maximum likelihood estimate;
percentiles;
DISCRIMINATION;
D O I:
10.1002/qre.2308
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
In this paper, robust control charts for percentiles based on location-scale family of distributions are proposed. In the construction of control charts for percentiles, when the underlying distribution of the quality measurement is unknown, we study the problem of discriminating different possible candidate distributions in the location-scale family of distributions and obtain control charts for percentiles which are insensitive to model mis-specification. Two approaches, namely, the random data-driven model selection approach and weighted modeling approach, are used to construct the robust control charts for percentiles in order to effectively monitor the manufacturing process. Monte Carlo simulation studies are conducted to evaluate the performance of the proposed robust control charts for various settings with different percentiles, false-alarm rates, and sample sizes. These proposed procedures are compared in terms of the average run length. The proposed robust control charts are applied to real data sets for the illustration of robustness and usefulness.
机构:
Univ Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South AfricaUniv Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South Africa
Hazra, Nil Kamal
Kuiti, Mithu Rani
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机构:
IIMC, Dept Operat Management, Diamond Harbour Rd, Kolkata 700104, IndiaUniv Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South Africa
Kuiti, Mithu Rani
Finkelstein, Maxim
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机构:
Univ Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South Africa
ITMO Univ, St Petersburg, RussiaUniv Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South Africa
Finkelstein, Maxim
Nanda, Asok K.
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h-index: 0
机构:
Indian Inst Sci Educ & Res IISER Kolkata, Dept Math & Stat, Mohanpur 741246, IndiaUniv Free State, Dept Math Stat & Actuarial Sci, ZA-9300 Bloemfontein, South Africa