Architecture drives test system standards

被引：2

作者：

Mueller, J ^{[1
]}

Oblad, R

机构：

[1] Agilent Technol Inc, Measurement Connect Ctr Technol, Loveland, CO USA

[2] Agilent Technol, Elect Prod & Solut Grp, Santa Rosa, CA USA

来源：

IEEE SPECTRUM | 2000年 / 37卷 / 09期

关键词：

D O I：

10.1109/6.866287

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Currently, the Interchangeable Virtual Instruments (IVI) Foundation, is working on standards that will simply the development and use of automated test systems. With an initial release expected in early 2001, the IVI specifications encompass the basic instrument control and driver architecture through more complex system solutions. In theory, a test engineer should be able to exchange a new instrument for an existing one within a system and reconfigure that system too use the appropriate driver.

引用

页码：68 / 73

页数：6

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