Growth of Nanocrystalline Cu2ZnSnS4 Thin Films using the Spray Pyrolysis Technique and their Characterization

被引：0

作者：

Chandel, Tarun ^{[1
]}

Halaszova, Sona ^{[2
]}

Prochazka, Michal ^{[2
]}

Hasko, Daniel ^{[3
]}

Velic, Dusan ^{[2
,3
]}

Thakur, Vikas ^{[4
]}

Dwivedi, Shailendra Kumar ^{[1
]}

Zaman, M. Buhanuz ^{[1
]}

Rajaram, Poolla ^{[1
]}

机构：

[1] Jiwaji Univ, Sch Studies Phys, Gwalior 474011, India

[2] Comenius Univ, Fac Nat Sci, Ilkovicova 6, Bratislava 84215, Slovakia

[3] Int Laser Ctr, Ilkovicova 3, Bratislava 81219, Slovakia

[4] Wuhan Univ, Sch Power & Mech Engn, Wuhan 430072, Hubei, Peoples R China

来源：

2ND INTERNATIONAL CONFERENCE ON CONDENSED MATTER AND APPLIED PHYSICS (ICC-2017) | 2018年 / 1953卷

关键词：

D O I：

10.1063/1.5032940

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanocrystalline thin films of Cu2ZnSnS4 (CZTS) were grown on the glass substrates using the spray pyrolysis technique. The films were grown at a substrate temperature of 300 degrees C after which they were annealed at 350 degrees C in vacuum. X-ray diffraction (XRD) studies showed that the films crystallized in the kesterite structure. Energy dispersive analysis of X-rays (EDAX) studies showed that the films possess the desired stoichiometry i.e. the proportion of Cu:Zn:Sn:S in the CZTS solid solution is close to 2:1:1:4. Secondary Ions Mass Spectroscopy (SIMS) depth profiling confirmed the uniformity in elemental composition along the depth of the films. SEM studies showed that the films are covered with CZTS particles forming sheet like structures. AFM studies show that the size of the particles on the surface of the films is around 10 -15 nm. UV-VIS-NIR transmission spectra were used to determine the optical band gap of the CZTS films which was found to be around 1.55eV.

引用

页数：4

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